3D Noncontact Profilometer
[ST400, NANOVEA, USA]
Located at: CRF Annexe - F01
Features: 2D & 3D surface measurement & imaging (200mm x 150mm X-Y axis continuous scan with speed up to 40 mm/s)
Specification: Sample scanning size is 150mm x 150mm; Maximum weight of the sample is 8kg; Height range is 2.5nm to 25mm
Facilities: Nanovea ST400 3D Non-contact Profiler with motorized Z-stage; High speed 110µm & 3mm sensors; 5x & 20x polarized & long working distance objective lenses; Video microscope for advanced imaging; Expert 3D-GP software for analysis.
Applications of 3D-Non Contact Profilometer
• Roughness & Finish with imaging
• Texture
• Flatness & Warpage
• Volume & Area
• Geometry & Shape
• Step height & Thickness
Testing charges.
|
Area Scan [per sample per hour] |
Profile Scan# [per sample] |
NITK |
Rs. 550/- |
Rs. 50/- |
Academic & research institutes* |
Rs. 900/- |
Rs. 100/- |
Industries* |
Rs. 3300/- |
Rs. 400/- |
#[Report preparation charges Rs. 550/- per hour ]
*Sample preparation charges is not included, GST(18%) extra.