3D Noncontact Profilometer [ST400, NANOVEA, USA]

Features: 2D & 3D surface measurement & imaging (200mm × 150mm X-Y axis continuous scan with speed up to 40 mm/s)

Specification: Sample scanning size is 150mm×150mm; Maximum weight of the sample is 8kg; Height range is 2.5nm to 25mm

Located at: CRF Annexe - F01
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Facilities: Nanovea ST400 3D Non-contact Profiler with motorized Z-stage; High speed 110µm & 3mm sensors; 5x & 20x polarized & long working distance objective lenses; Video microscope for advanced imaging; Expert 3D-GP software for analysis:

Applications of 3D-Non Contact Profilometer

Roughness & Finish with imaging


Flatness & Warpage

Volume & Area

Geometry & Shape

Step height & Thickness

Per sample per hour (for area scan) Per sample (for profile scan)
[Report preperation charges Rs. 550/- per hour ]
NITK Rs. 550/- Rs. 50/-
Academic & research institutes* Rs. 900/- Rs. 100/-
Industries* Rs. 3300/- Rs. 400/-

*Sample preparation charges is not included, GST(18%) extra.

For further Query Contact:

Mr. Pradeep S. P (Technical Staff CRF) Mob: +91-9741381322, Email: crf_profilo@nitk.edu.in

Dr. Keyur Raval (Faculty in-charge) Mob: +91-9342421444, Email: keyurnraval@nitk.edu.in