HR-FESEM [GEMINI 300, Carl Zeiss, Germany]

Features: Schottky type field emitter; Resolution: 0.7 nm @15 kV, 1.2 nm @1 kV

Located at: CRF Annexe - G01
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Facilities: High efficiency annular in-lens SE detector system, Energy selective back scattered detector for pure SE, pure BSE, and a mixture of SE+BSE signals, Everhart-Thornley detector, Six segment back scattered detector for Z contrast and crystal orientation, Quorum coater with gold, carbon and platinum source, PV 7600 SU A EDAX Octane super EDS System-SDD 70mm, EDAX Team EBSD system with Hikari plus, EDAX TEAM WDS-Texas HP stand alone system, aSTEM detector with tilt tomography holder with 0.6 nm @ 30 kV- Dark field (DF), Bright field (BF), Oriented dark field (ODF), annular dark field (ADF), High angular dark field (HAADF), 12 numbers of 3 mm TEM grids.

Applications of Field Emission Gun Scanning Electron Microscope (FEGSEM)

Imaging –Grains, grain boundaries, their distribution in metals and alloys

Dendrites, dendrite arms, their placings, coring in castings

Study of inclusions, slags, oxides, second phase investigations in metals and alloys

Indications of deformations in deformed materials (rolling, forging, extrusions)

Study of fractured surfaces (in failure analysis, forensic investigations)

Study of composites (reinforcement distribution, interface reactions, etc.)

Study of nanomaterials, biomaterials, energy materials, water purification media

Study of ores and minerals, concrete materials (concrete mixes, cements, reinforcement steels), etc.

Study of tribological systems (wear, erosion, abrasion)

Textures in materials, pole figure mapping

Composition mapping (point, line and area) using EDS and WDS

Cored structures in nanomaterials

Remaining life estimation of expensive and high risk structures

Study of functional materials (nanoparticles, nanofibers, films, reflective and magnetic coatings, etc.)

Important Note : Submission of samples prior to minimum 1 day is mandatory. otherwise the slot/form will be cancelled. No excuses/ permissions will be considered. And also we will not analyse the samples which brought on the same date of analysis even if it is/was in the desiccator. Samples must be submitted before 4pm (Monday - Friday). Late submission of samples will not be considered.

General Guidelines for FESEM Users

For the safety and longevity of FESEM at CRF, the following guideline are framed and users are expected to adhere to the same.
The samples will be rejected if the below instructions are not followed by the users.

The protocols to be followed are:
Preparation of any kind of sample is entirely the reposibility of users.

1. The samples should not should contain any acrylic/epoxy material.

2. Samples must be dry, free of moisture, free of oil and grease; Samples must be dessicated.

3. For Powder samples min. quantity 5mg, All analysis on non-mettalic and magnetic powder samples will be carried out below 3kV.

4. For solid (non-Degassing), size should be <= 1cm dimension per sample, height <= 1cm. if possible clean the sample with ethanol to remove oil and dust.

5. Since the current model of FESEM is not suitable for measuring biological samples (tissues, cells, etc). The CRF will not accept such samples.

6. Samples should not have any degassing species.

7. For Polymer and other non-conducting samples, analysis will be done @ < 4kV.

Testing charges.

Details Charge Basis NITK Academia / R&D (Externals) Industry
Only Imaging or Only EDS [max. 20 mins] Per Sample Rs. 600/- Rs. 1000/- Rs. 2000/-
Images + EDS [max. 30 mins] (10 images + 2 regions) Per Sample Rs. 850/- Rs. 1400/- Rs. 2750/-
EDS Mapping or Line Scan (Per Scan) Per Sample Rs. 700/- Rs. 1200/- Rs. 2300/-
Images + Mapping or Line Scan (10 images + per scan) Per Sample Rs. 950/- Rs. 1600/- Rs. 3050/-
Images + EDS + Mapping or Line Scan Per Sample Rs. 1100/- Rs. 1800/- Rs. 3500/-
Images + EDS + Mapping + Line Scan Per Sample Rs. 1250/- Rs. 2000/- Rs. 4000/-
Sputtering (Gold Coating) [Std. 100 sec] For non-conducting sample Per Sample Rs. 100/- Rs. 150/- Rs. 300/-
EBSD [Excluding sample preparation] Per Hour Rs. 1500/- Rs. 2500/- Rs. 3500/-

*Extra images and EDS will be charged Rs. 100/- per region.

*Extra Mapping and Line Scan will be charged Rs. 250/- per scan.

*GST(18%) extra. Above charges are for providing raw data.

For further Query Contact:

Mrs. Pratheeksha K P (Technical Staff, CRF ), Email: crf_hrfesem@nitk.edu.in

Prof. M. N. Satyanarayan (FESEM Faculty in-charge), Email: satya_mn@nitk.edu.in