CRF | AFM

Atomic Force Microscope
[Flex-Axiom AFM, M/s Nanosurf, Switzerland]

Located at: CRF Block - F01

Feature:

a) Flat and linear scanning

b) Measurement versatility - scanning in liquid and a multitude of measurement modes

c) Flexible stage and exchangeable cantilever holders

Resolution/Specification:

a) Scan head type (Max. scan range): 100 μm and 10 μm

b) Sample size: 100 mm on sample stage

c) Manual height adjustment range: 6 mm

d) Motorized approach range (at tip position): 2 mm

List of Facilities:

a) Operating modes

i) Static Force, Lateral Force, Dynamic Force, Piezo Force, Force modulation
ii) Phase contrast
iii) Magnetic Force Microscope
iv) Electrostatic force microscopy
v) Lithography and manipulation modes

b) Spectroscopy modes

i) Force-distance
ii) Amplitude-distance
iii) Phase-distance
iv) Tip current-tip voltage

Application Domain:

• Biomaterials
• Lithography
• Tribology
• Nanomechanical and nanoelectrical characterization
• Thin films and coatings
• Polymers
• Graphene and 2D materials

Testing charges.

	Tapping	Contact	EFM	MFM
NITK [per hour]	Rs. 300/-	Rs. 600/-	Rs. 1000/-	Rs. 1000/-
Academic & Research Institute* [per hour]	Rs. 450/-	Rs. 750/-	Rs. 1250/-	Rs. 1250/-
Industry*	Rs. 1000/-	Rs. 2000/-	Rs. 3000/-	Rs. 3000/-

*Sample preparation charges, GST(18%) extra. Above charges are for providing raw data.

For further Query Contact:

Mr. Pradeep S. P (Technical Staff, CRF) Email: crf_afm@nitk.edu.in

Prof. M.N. Satyanarayan (Faculty in-charge) Mob: +91-9686146138, Email: satya_mn@nitk.edu.in

Atomic Force Microscope [Flex-Axiom AFM, M/s Nanosurf, Switzerland]